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	1.	Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / edited by J. Donecker and I. Rechneberg. by Donecker, J., ed Rechenberg, I., ed International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany) Series: Institute of physics series ; no. 160 Material type: Text; Format: print ; Literary form: Not fiction Publication details: Bristol ; Institute of Physics Pub., 1998 Availability: Items available for loan: Department of Physics (1)Call number: 621.3815/2 DON. Add to cart (remove)
	2.	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, Subhash Mahajan, James W. Corbett. by Mahajan, Subhash., ed Corbett, James W., ed Series: Materials research society symposia proceedings Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : North-Holland, c1983 Availability: Items available for loan: Department of Physics (1)Call number: 537.6/22 MAH. Add to cart (remove)
	3.	Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. / editors, J. Narayan and T. Y. Tan. by Narayan, J., ed Tan, T. Y., ed Materials Research Society Series: Materials Research Society symposia proceedings ; v. 2. Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : North Holland, c1981 Availability: Items available for loan: Department of Physics (1)Call number: 537.6/22 NAR. Add to cart (remove)
	4.	Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / edited by J. Donecker and I. Rechneberg. by Donecker, J., ed Rechenberg, I., ed International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany) Series: Institute of physics series ; no. 160 Material type: Text; Format: print ; Literary form: Not fiction Publication details: Bristol ; Institute of Physics Pub., 1998 Availability: No items available. Add to cart (remove)
	5.	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, Subhash Mahajan, James W. Corbett. by Mahajan, Subhash., ed Corbett, James W., ed Series: Materials research society symposia proceedings Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : North-Holland, c1983 Availability: No items available. Add to cart (remove)
	6.	Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. / editors, J. Narayan and T. Y. Tan. by Narayan, J., ed Tan, T. Y., ed Materials Research Society Series: Materials Research Society symposia proceedings ; v. 2. Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : North Holland, c1981 Availability: No items available. Add to cart (remove)

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