Normal view MARC view ISBD view

Principles of semiconductor network testing /

Afshar, Amir.

Principles of semiconductor network testing / Amir Afshar. - Boston : Butterworth-Heinemann, c1995. - xiv, 213 p. : ill. ; 25 cm.

ISBN: 0750694726

Subjects--Index Terms: Integrated circuits--Testing. Semiconductors--Testing.

Dewey Class. No.: 621.3815/48 / AFS

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)