Principles of semiconductor network testing / Amir Afshar.

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Material type: Text

TextPublication details: Boston : Butterworth-Heinemann, c1995.Description: xiv, 213 p. : ill. ; 25 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Department of Physics	621.3815/48 AFS (Browse shelf(Opens below))	Available		phy012641

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