Principles of semiconductor network testing / (Record no. 149260)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00509cam a2200157 a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20160318124917.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 950317s1995 maua b 001 0 eng |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815/48 |
| Item number | AFS |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0750694726 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Afshar, Amir. |
| 9 (RLIN) | 5632 |
| 245 10 - TITLE STATEMENT | |
| Title | Principles of semiconductor network testing / |
| Statement of responsibility, etc. | Amir Afshar. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Boston : |
| Name of publisher, distributor, etc. | Butterworth-Heinemann, |
| Date of publication, distribution, etc. | c1995. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 213 p. : |
| Other physical details | ill. ; |
| Dimensions | 25 cm. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Integrated circuits--Testing. |
| -- | Semiconductors--Testing. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Department of Physics | Department of Physics | 03/05/2010 | 621.3815/48 AFS | phy012641 | 03/18/2016 | 03/18/2016 | Books |