Diffraction and imaging techniques in material science /
Diffraction and imaging techniques in material science / 2v.; v1. electron microscopy, v2. imaging and diffraction techniques
editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
- 2d, rev. ed.
- Amsterdam ; North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.
- 2 v. (xvii, 847 p., [1] fold. leaf of plates) : ill. ; 23 cm.
0444851305
Electron microscopy--Congresses. Electrons--Diffraction--Congresses. Imaging systems--Congresses.
620.1/127 / AME
0444851305
Electron microscopy--Congresses. Electrons--Diffraction--Congresses. Imaging systems--Congresses.
620.1/127 / AME