Diffraction and imaging techniques in material science / (Record no. 266135)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00885cam a2200193 i 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220519104852.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 780928s1978 ne af b 101 0 eng |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.1/127 |
| Item number | AME |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0444851305 |
| 245 00 - TITLE STATEMENT | |
| Title | Diffraction and imaging techniques in material science / |
| Statement of responsibility, etc. | editors, S. Amelinckx, R. Gevers, J. Van Landuyt. |
| Remainder of title | 2v.; v1. electron microscopy, v2. imaging and diffraction techniques |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2d, rev. ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Amsterdam ; |
| Name of publisher, distributor, etc. | North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, |
| Date of publication, distribution, etc. | 1978. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 2 v. (xvii, 847 p., [1] fold. leaf of plates) : |
| Other physical details | ill. ; |
| Dimensions | 23 cm. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Electron microscopy--Congresses. |
| -- | Electrons--Diffraction--Congresses. |
| -- | Imaging systems--Congresses. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Amelinckx, S., ed. |
| 9 (RLIN) | 5379 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Gevers, R., ed. |
| 9 (RLIN) | 5380 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Landuyt, J. van., ed. |
| 9 (RLIN) | 5381 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
No items available.