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Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
Material type:
TextSeries: Optical engineering (Marcel Dekker, Inc.) ; v. 1.Publication details: New York : Marcel Dekker, c1982.Description: xiv, 793 p. : ill. ; 27 cmISBN: - 0824715535
- 502/.8/25 MUR
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Department of Physics | 502/.8/25 MUR (Browse shelf(Opens below)) | 1 | Available | PHY007343 | |
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Department of Physics | 502/.8/25 MUR;1 (Browse shelf(Opens below)) | 2 | Available | PHY008124 |
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| 502/.8/2 SCH X-ray microscopy : | 502/.8/25 CHA.1 Understanding & optimising electron microscope performance / | 502.825 GOL Scanning Electron Microscopy and X-Ray Microanalysis / | 502/.8/25 MUR Electron and ion microscopy and microanalysis : | 502/.8/25 MUR;1 Electron and ion microscopy and microanalysis : | 502/.8/25 RUS The early development of electron lenses and electron microscopy / | 502.825 SIN Electron microscopy |
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