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VLSI test principles and architectures: design for testability
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TextSeries: (Morgan Kaufmann series in systems on silicon)Publication details: Amsterdam Elsevier 2006 Description: xxx, 777pISBN: - 0-12-370597-5
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University Library | 621.3.049.77 WAN (Browse shelf(Opens below)) | Available | 00056985 |
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| 621.3.049.77 VLS VLSI design '99: VLSI for the information appliance, proceedings of the 12th international conference on VLSI design, January 7-10, 1999, Goa, India | 621.3.049.77 VOI High-frequency integrated circuits | 621.3.049.77 VOR Fast analytical techniques for electrical and electronic circuits | 621.3.049.77 WAN VLSI test principles and architectures: | 621.3.049.77 WAN Trouble shooting solid state circuits and systems | 621.3.049.77 WANG Digital circuit testing: | 621.3.049.77 WAS Nanoelectronics and information technology |
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