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	1.	Principles of semiconductor network testing / Amir Afshar. by Afshar, Amir Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston : Butterworth-Heinemann, c1995 Availability: Items available for loan: Department of Physics (1)Call number: 621.3815/48 AFS. Add to cart (remove)
	2.	Principles of semiconductor network testing / Amir Afshar. by Afshar, Amir Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston : Butterworth-Heinemann, c1995 Availability: No items available. Add to cart (remove)
	3.	Random testing of digital circuits theory and applications by David, Rene Publication details: New York Marcel Dekker 1998 Availability: Items available for reference: School of Engineering: Not for loan (1). Add to cart (remove)

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