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Principles of semiconductor network testing / Amir Afshar.
Material type:
TextPublication details: Boston : Butterworth-Heinemann, c1995.Description: xiv, 213 p. : ill. ; 25 cmISBN: - 0750694726
- 621.3815/48 AFS
| Item type | Current library | Call number | Status | Date due | Barcode |
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Department of Physics | 621.3815/48 AFS (Browse shelf(Opens below)) | Available | phy012641 |
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| 621.3815/42 ONO Electroluminescent displays / | 621.3815/42 ONO;1 Electroluminescent displays / | 621.3815/422 YEH Optics of liquid crystal displays / | 621.3815/48 AFS Principles of semiconductor network testing / | 621.381/548 KHA Modern electronic equipment | 621.381/7 BAP Theory and problems in microelectronics | 621.381/7 ELK Silicon devices and process integration : |
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